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| Manufacturer Part Number: | SN74BCT8374ADWR |
| Manufacturer: | Texas Instruments |
| Part of Description: | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Lead Free Status / RoHS Status: | Lead Free / RoHS Compliant |
| Stock Condition: | 2685 In Stock |
| Ship From: | Hong Kong |
| Shipment Way: | DHL/Fedex/TNT/UPS/EMS |
| Type | Description |
|---|---|
| Series | 74BCT |
| Package | Tape & Reel (TR) |
| Part Status | Obsolete |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
Stock Status: 2685
Minimum: 1
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